Electron Beam Ion Sources, Ion Optical Elements and Beam Diagnostics for Particle Accelerators
نویسندگان
چکیده
Electron Beam Ion Sources (EBISs) provide highly charged ions (HCIs) for a variety of investigations and applications, e.g. amongst others as injection source for particle accelerators. EBISs feature a lot of advantages which qualify them for accelerator injection, and which partly compensate for their comparatively low number of particles. DREEBIT GmbH provides a family of compact EBISs based on permanent magnets. A more sophisticated version is based on cryogen-free superconducting magnets providing a significantly higher ion output. Based on this ion source technology complete lowenergy beamlines provide a wide range of projectiles, i.e. almost any available element with charge states up to bare ions with energies of some tens of eV up to 1 MeV. Due to their specific application the beamlines comprise a variety of ion optical elements as well as various ion beam diagnostics.
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